A practical method to determine the spatial resolution of GEM detector
A practical method to determine the spatial resolution of GEM detector
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DOI：
10.1016/j.nima.2012.10.078
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发表时间：
2013-02
影响因子：
1.4
通讯作者：
R. Wang;Y. Huang;Z. Xiao;Zhao Zhang;Rong Wang;Haiyan Gao
中科院分区：
文献类型：
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作者：
R. Wang;Y. Huang;Z. Xiao;Zhao Zhang;Rong Wang;Haiyan Gao
利用可调狭缝Fe-55源，提出了一种确定一维气态电子倍增（GEM）原型空间分辨率的新方法。在该方法中，由GEM空间分辨率和狭缝几何接受度贡献的入射位置总方差σtot2表示为全能量峰下事件率n的函数，并利用后者来标定狭缝宽度的平方。对实验数据进行线性拟合，得到了σg=56±15μm（1σ）的空间分辨率。与现有方法相比，考虑到直接测量狭缝宽度的不准确性，本文提出的新方法具有鲁棒性，从而大大避免了加工困难。
A new method to determine the spatial resolution of a one-dimensional gaseous electron multiplication (GEM) prototype is demonstrated via an experimental test using an Fe-55 source with an adjustable slit. In this method, the total variance of the incident position σtot2, contributed by the GEM spatial resolution and the geometrical acceptance of the slit, is presented as a function of the event rate n under the full energy peak, with the latter being employed to calibrate the square of the slit width. Using a linear fit to the experimental data, a spatial resolution of σg=56±15μm(1σ)is measured. Compared to the existing methods, the novel method presented here is robust considering the inaccuracy in the direct measurements of the slit widths, and hence greatly circumvents machining difficulties.