Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs
Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs
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DOI：
10.1109/ted.2019.2942783
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发表时间：
2019-10
影响因子：
3.1
通讯作者：
A. Pacheco-Sánchez;I. Bejenari;M. Schröter
中科院分区：
文献类型：
--
作者：
A. Pacheco-Sánchez;I. Bejenari;M. Schröter
根据温度依赖的二端口网络分析方法，首次从无陷阱高频特性中提取了多管多指碳纳米管场效应晶体管（CNTFET）的热阻、热容和热时间常数.提取的短热时间常数证实了这种新兴技术的热稳定性。本文提出了一种适用于多管碳纳米管的集总元件电热模型，并用实验数据进行了验证。
The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port network analysis. The extracted short thermal time constant confirms the thermal stability for this emerging technology. A lumped-element electro-thermal model for multi-tube CNTFETs has been developed and proven with experimental data.