Local mechanical and electrical behavior in CdTe thin film solar cells revealed by scanning probe microscopy
Local mechanical and electrical behavior in CdTe thin film solar cells revealed by scanning probe microscopy
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DOI：
10.1063/1.5093906
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发表时间：
2019-08
期刊：
影响因子：
1.6
通讯作者：
M. Mathews;Liping Guo;Xiao Han;Swapnil Saurav;G. Xing;Lin Li;Feng Yan
中科院分区：
文献类型：
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作者：
M. Mathews;Liping Guo;Xiao Han;Swapnil Saurav;G. Xing;Lin Li;Feng Yan
用扫描探针显微镜研究了薄膜太阳电池的纳米级电性能和力学性能。用导电原子力显微镜(CAFM)和力调制显微镜(FMM)研究了生长的和处理过的CdTe薄膜的晶界和晶界的局域电学和力学性能。记录了处理后的薄膜中电学行为的增加和弹性硬度的降低，以说明这是由于CdTe颗粒的生长造成的。在对CdTe薄膜太阳电池施加模拟工作偏置时，通过在薄膜两端施加电场可以增加薄膜的柔软度。结果表明，在CdTe晶界存在一个潜在的机械失效位置，这可能导致器件退化。利用扫描探针显微镜研究了纳米级的CdTe薄膜太阳电池的电学和力学性能。用导电原子力显微镜(CAFM)和力调制显微镜(FMM)研究了生长的和处理过的CdTe薄膜的晶界和晶界的局域电学和力学性能。记录了处理后的薄膜中电学行为的增加和弹性硬度的降低，以说明这是由于CdTe颗粒的生长造成的。在对CdTe薄膜太阳电池施加模拟工作偏置时，通过在薄膜两端施加电场可以增加薄膜的柔软度。结果表明，在CdTe晶界上存在一个潜在的机械失效位置，这可能导致器件退化。
The nanoscale electrical and mechanical properties in the CdTe thin films solar cells were investigated using the scanning probe microscopy. The comparative localized electrical and mechanical properties between as-grown and CdCl2 treated CdTe thin films for the grain and grain boundaries were studied using the conductive atomic force microscopy (cAFM) and force modulation microscopy (FMM). An increased electrical behavior and decreased elastic stiffness in the CdCl2 treated thin films were recorded to elucidate the impact from the grain growth of CdTe grains. On applying a simulated working electrical bias into the CdTe thin-film solar cells, the electric field across the CdTe film can increase the softness of CdTe thin film. The results imply the presence of a potential mechanical failure site in the CdTe grain boundary, which may lead to device degradation.The nanoscale electrical and mechanical properties in the CdTe thin films solar cells were investigated using the scanning probe microscopy. The comparative localized electrical and mechanical properties between as-grown and CdCl2 treated CdTe thin films for the grain and grain boundaries were studied using the conductive atomic force microscopy (cAFM) and force modulation microscopy (FMM). An increased electrical behavior and decreased elastic stiffness in the CdCl2 treated thin films were recorded to elucidate the impact from the grain growth of CdTe grains. On applying a simulated working electrical bias into the CdTe thin-film solar cells, the electric field across the CdTe film can increase the softness of CdTe thin film. The results imply the presence of a potential mechanical failure site in the CdTe grain boundary, which may lead to device degradation.