On the optical stability of high-resolution transmission electron microscopes
On the optical stability of high-resolution transmission electron microscopes
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DOI：
10.1016/j.ultramic.2013.05.001
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发表时间：
2013-11-01
期刊：
影响因子：
2.2
通讯作者：
Thust, A.
中科院分区：
文献类型：
--
作者：
Barthel, J.;Thust, A.
近二十年来，通过引入硬件像差校正器和将可实现的分辨率提高到亚埃级别，高分辨率电子显微镜技术经历了前所未有的进步。在给定分辨率下的像差校正还需要定义良好的光学稳定性这一重要方面，到目前为止还很少受到关注。因此，我们研究了各种高分辨率电子显微镜在光学寿命方面维持像差校正光学状态的资格。我们开发了一个全面的统计框架来估计光学寿命，并发现在几十秒到几分钟之间有非常低的值。引入了概率曲线，它告诉操作员在完全像差校正状态下仍然工作的机会。(C)2013爱思唯尔B.V.保留所有权利。
In the recent two decades the technique of high-resolution transmission electron microscopy experienced an unprecedented progress through the introduction of hardware aberration correctors and by the improvement of the achievable resolution to the sub-Angstrom level. The important aspect that aberration correction at a given resolution requires also a well defined amount of optical stability has received little attention so far. Therefore we investigate the qualification of a variety of high-resolution electron microscopes to maintain an aberration corrected optical state in terms of an optical lifetime. We develop a comprehensive statistical framework for the estimation of the optical lifetime and find remarkably low values between tens of seconds and a couple of minutes. Probability curves are introduced, which inform the operator about the chance to work still in the fully aberration corrected state. (C) 2013 Elsevier B.V. All rights reserved.