On test data volume reduction for multiple scan chain designs
On test data volume reduction for multiple scan chain designs
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DOI:
10.1109/vts.2002.1011119
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发表时间:
2002-04
期刊:
影响因子:
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通讯作者:
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz
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文献类型:
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作者:
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz
We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming a combinational decompressor circuit.