On test data volume reduction for multiple scan chain designs

On test data volume reduction for multiple scan chain designs
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DOI:
10.1109/vts.2002.1011119
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发表时间:
2002-04
期刊:
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)
影响因子:
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通讯作者:
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz
中科院分区:
其他
文献类型:
--
作者:
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz

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我们考虑了与具有多个扫描链的设计中扫描测试数据减少有关的问题。我们提出了一个可以用于评估减少扫描数据量的程序的有效性的度量。该度量将所达到的压缩与使用多个扫描链的固有的压缩进行了比较。我们还提出了一个修改给定测试集的程序,以便假设组合解压缩器电路的测试数据量减少。
We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming a combinational decompressor circuit.