Instability of planar interfaces in reaction-diffusion systems
Instability of planar interfaces in reaction-diffusion systems
复制标题
反应扩散系统中平面界面的不稳定性
DOI:
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发表时间:
1994
期刊:
影响因子:
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通讯作者:
Y. Nishiura
中科院分区:
文献类型:
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作者:
M. Taniguchi;Y. Nishiura
Instability of planar front solutions to reaction-diffusion systems in two space dimensions is studied. Let $varepsilon $ denote the width of interface. Then the planar front solution—or a solution having an internal transition layer which is flat—loses its stability when the length of interface along the tangential direction exceeds $O(varepsilon ^{{1 /2}} )$. The wavelength of the fastest growth is of $O(varepsilon ^{{1 /3}} )$ which is inherent in the system and determined by the nonlinearity and diffusion coefficients. Complete asymptotic characterization of these quantities as $varepsilon o 0$ is given by the analysis of what is called the singular dispersion relation derived from the linearized eigenvalue problem. The numerical computations also confirm that the theoretically predicted fastest growth wavy pattern actually arises from a randomly perturbed planar front.