Semi-automation Delta-L for PCB Loss Electrical Characterization
Semi-automation Delta-L for PCB Loss Electrical Characterization
复制标题
用于 PCB 损耗电气表征的半自动化 Delta-L
DOI:
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发表时间:
2018
期刊:
影响因子:
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通讯作者:
Denis Chen
中科院分区:
文献类型:
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作者:
J. Hsu;Cucumber Lin;Morgan Ku;T. Su;Denis Chen
In high-frequency electrical characterization, it is very important to have good measurement stability and repeatability. Conventionally, co-axial connector is used for the high quality and robust measurement. Handheld probes with the accepted quality were validated and widely adopted to reduce the measurement resource. However, the measurement quality by different users are much different in the round robin study and these difference may cause by the probe design, contact quality, measurement setup, engineer operation and etc. How to reduce the measurement variation affected by engineer operation in high-volume measurement is critical, especially for over 20GHz high-frequency application. Therefore, semi-automation Delta-L solution was proposed and developed for PCB loss characterization to improve the measurement stability and reduce the variation caused by engineer operation.