(Digital Presentation) Investigation of Top Electrodes Impact on Performance of Transparent Amorphous Indium Gallium Zinc Oxide (a-InGaZnO) Based Resistive Random Access Memory
(Digital Presentation) Investigation of Top Electrodes Impact on Performance of Transparent Amorphous Indium Gallium Zinc Oxide (a-InGaZnO) Based Resistive Random Access Memory
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(数字演示)顶部电极对透明非晶氧化铟镓锌 (a-InGaZnO) 基电阻式随机存取存储器性能影响的研究
DOI:
10.1149/ma2022-01191075mtgabs
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发表时间:
2022
期刊:
影响因子:
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通讯作者:
Lee, Sunghwan
中科院分区:
文献类型:
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作者:
Qin, Fei;Lee, Sunghwan