(Digital Presentation) Investigation of Top Electrodes Impact on Performance of Transparent Amorphous Indium Gallium Zinc Oxide (a-InGaZnO) Based Resistive Random Access Memory

(Digital Presentation) Investigation of Top Electrodes Impact on Performance of Transparent Amorphous Indium Gallium Zinc Oxide (a-InGaZnO) Based Resistive Random Access Memory
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(数字演示)顶部电极对透明非晶氧化铟镓锌 (a-InGaZnO) 基电阻式随机存取存储器性能影响的研究

DOI:
10.1149/ma2022-01191075mtgabs
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发表时间:
2022
期刊:
ECS Meeting Abstracts
影响因子:
--
通讯作者:
Lee, Sunghwan
Lee, Sunghwan
中科院分区:
--
文献类型:
--
作者:
Qin, Fei;Lee, Sunghwan

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