Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes
Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes
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DOI：
10.1103/physrevb.79.235421
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发表时间：
2009-06-01
影响因子：
3.7
通讯作者：
Szoszkiewicz, Robert
中科院分区：
文献类型：
--
作者：
Gnecco, Enrico;Riedo, Elisa;Szoszkiewicz, Robert
我们讨论了由加热原子力显微镜(AFM)针尖扫描几种非晶态聚合物表面产生的纳米级表面起伏(波纹)的时间和温度演变。在线性之字形扫描过程中，我们在一定的扫描速率和探头温度范围内获得了近似垂直于快扫描方向的伪线性波纹。正如预期的那样，每种聚合物的波纹在玻璃化温度附近大幅增加。我们还研究了AFM尖端遵循圆形路径的另一种情况。与“稳定的”线性波纹相反，我们得到了在连续扫描期间沿扫描路径旋转的圆形波纹。圆形波纹的群速度比扫描速度低2个数量级。我们使用一个唯象模型来解释实验数据，该模型考虑了探测尖端引起的侵蚀和平滑效应。
We discuss the time and temperature evolution of the nanometer-scale surface undulations (ripples) produced by a heated atomic force microscope (AFM) tip scanning across surfaces of several amorphous polymers. During linear zigzag scanning we obtain pseudolinear ripples approximately perpendicular to the fast scan direction in a range of scan rates and probe temperatures. As expected, the size of the ripples increases massively in the vicinity of the glass temperature for each polymer. We also examine a different case in which the AFM tip follows a circular path. Contrary to the "steady" linear ripples we obtain circular ripples which rotate along the scanning path during consecutive scans. The group velocity of the circular ripples is 2 orders of magnitude lower than the scan speed. We interpret the experimental data using a phenomenological model accounting for erosion and smoothing effects caused by the probing tip.