Non-Destructive Thickness Measurement Using Quasi-Static Resonators
Non-Destructive Thickness Measurement Using Quasi-Static Resonators
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DOI：
10.1109/lmwc.2013.2249056
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发表时间：
2013-04-01
影响因子：
3
通讯作者：
Ramahi, Omar M.
中科院分区：
文献类型：
--
作者：
Boybay, Muhammed S.;Ramahi, Omar M.
介绍了一种用于介质厚度无损测量的微波传感器。该传感器是一种准静态谐振器，基于互补开口环谐振器（CSRR）结构。当CSRR结构由覆盖有介电层的导电介质支撑时，CSRR的谐振频率对介电层的厚度具有很强的依赖性。数值分析了CSRR传感器尺寸对灵敏度的影响。为了实验验证，CSRR传感器，工作在1.6至2.3 GHz的频带制作和激励的微带线。
A microwave sensor for non-destructive measurement of dielectric thickness is presented. The sensor is a quasi-static resonator and based on complementary split ring resonator (CSRR) structure. When the CSRR structure is backed by a conductive medium covered with a dielectric layer the resonance frequency of the CSRR has a strong dependence on the thickness of the dielectric layer. Effect of the size of CSRR sensor on the sensitivity is analyzed numerically. For experimental verification, a CSRR sensor that operates in the 1.6 to 2.3 GHz band is fabricated and excited by a microstrip line.