Slow Auger Relaxation in HgTe Colloidal Quantum Dots
Slow Auger Relaxation in HgTe Colloidal Quantum Dots
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DOI：
10.1021/acs.jpclett.8b00750
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发表时间：
2018-05-03
影响因子：
5.7
通讯作者：
Guyot-Sionnest, Philippe
中科院分区：
文献类型：
--
作者：
Melnychuk, Christopher;Guyot-Sionnest, Philippe
HGTE胶体量子点中的Biexciton寿命是粒径的函数。由两种合成方法产生的样品，导致部分聚集或散布良好的颗粒，表现出明显不同的动力学。部分聚集的HGTE的松弛特征抑制了螺旋螺旋寿命的可靠确定。在分散的HGTE量子点中，Biexciton寿命与颗粒体积大致增加，这确认了其他系统中观察到的趋势。提取的螺旋钻系数比具有相似能量差距的大量HGCDTE材料小三个数量级。我们在理解量子限制系统中的螺旋钻松弛及其与基于HGTE胶体量子点的中红外光电设备的相关性中讨论了这些发现。
The biexciton lifetimes in HgTe colloidal quantum dots are measured as a function of particle size. Samples produced by two synthetic methods, leading to partially aggregated or well-dispersed particles, exhibit markedly different dynamics. The relaxation characteristics of partially aggregated HgTe inhibit reliable determinations of the Auger lifetime. In well-dispersed HgTe quantum dots, the biexciton lifetime increases approximately linearly with particle volume, confirming trends observed in other systems. The extracted Auger coefficient is three orders of magnitude smaller than that for bulk HgCdTe materials with similar energy gaps. We discuss these findings in the context of understanding Auger relaxation in quantum-confined systems and their relevance to mid infrared optoelectronic devices based on HgTe colloidal quantum dots.