Towards reliable charge-mobility benchmark measurements for organic semiconductors
Towards reliable charge-mobility benchmark measurements for organic semiconductors
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DOI：
10.1016/j.orgel.2014.02.008
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发表时间：
2014-06-01
影响因子：
3.2
通讯作者：
Kim, Ji-Seon
中科院分区：
文献类型：
--
作者：
Blakesley, James C.;Castro, Fernando A.;Kim, Ji-Seon
载流子迁移率是一种通常用于评价有机半导体材料在固态照明或光伏等应用中的适用性的指标。虽然在相同的材料上发表的迁移率值有很大的变化，但在这些结果的可重复性的文献中很少有公开的讨论。我们通过使用空间电荷限制电流方法对一组有机半导体进行迁移率测量的实验室间研究来解决这个问题。我们发现，在名义上相同的设备上测量的迁移率可能相差一个数量级以上，最大的变化来源是不良的电极和薄膜厚度变化。此外，我们发现，不同科学家从相同数据中提取的流动性值通常会相差3倍。我们提出了一个分析和报告的协议，发现它可以将这种分析变化减少到20%。我们还提出了提高基准迁移率测量的可重复性的一般准则。爱思唯尔B.V.版权所有
Charge carrier mobility is a figure of merit commonly used to rate organic semiconducting materials for their suitability in applications such as solid-state lighting or photovoltaics. Although large variations are found in published mobility values on identical materials, there is little open discussion in the literature of the reproducibility of these results. We address this with an interlaboratory study of mobility measurements performed on a set of organic semiconductors using the space-charge limited current method. We found mobility measured on nominally identical devices could vary by more than one order of magnitude, with the largest sources of variation being poor electrodes and film thickness variation. Moreover, we found that mobility values extracted from identical data by different scientists would typically vary by a factor of 3. We propose a protocol for analysis and reporting that was found to reduce this analysis variation to as little as 20%. We also present general guidelines for improving the reproducibility of benchmark mobility measurements. Crown Copyright (C) 2014 Published by Elsevier B.V.