Towards performance and reliability-efficient computing in the dark silicon era
Towards performance and reliability-efficient computing in the dark silicon era
复制标题
在暗硅时代迈向性能和可靠性高效的计算
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
M. Shafique
中科院分区：
文献类型：
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作者：
J. Henkel;Santiago Pagani;Heba Khdr;F. Kriebel;Semeen Rehman;M. Shafique
本文讨论了由于电压缩放的高集成密度和障碍，因此现代片上系统中的功率密度和温度引起的问题。首先，讨论了新兴的黑暗硅问题，并列举了未来芯片中相应的关键研究挑战。之后，我们概述了一些关键的研究工作和概念，这些研究工作和概念利用了深色硅在功率或温度限制下对片上系统的性能和可靠性优化。总结的工程是芯片内部的传热以及灰色硅的不同性能和功率权衡，也就是说，在低于季节性的电压和频率水平下运行的潜在好处。除了实现可靠性异构体系结构外，片上系统的可靠性还可以通过利用黑暗硅来减速和弹性驱动的资源管理来减轻软误误。本文讨论的几种工具可在http://ces.itec.kit.edu/download上下载。
This paper discusses the power density and temperature induced issues in modern on-chip systems due to the high integration density and roadblock on the voltage scaling. First, the emerging dark silicon problem is discussed, and the corresponding critical research challenges in future chips are enumerated. Afterwards, we present an overview of some key research efforts and concepts that leverage dark silicon for performance and reliability optimization of on-chip systems under power or temperature constraints. The summarized works account for heat transfer inside a chip, as well as the varying performance and power trade-offs of gray silicon, that is, the potential benefits of operating at lower-than-nominal voltage and frequency levels. Besides realizing reliability-heterogeneous architectures, reliability of an on-chip system is enhanced by exploiting dark silicon for aging deceleration and resilience-driven resource management to mitigate soft-errors. Several of the tools discussed in this paper are available for download at http://ces.itec.kit.edu/download.