Nondestructive Observation of Thermal Fatigue Crack Propagation in FBGA and Die Attached Solder Joints by Synchrotron Radiation X-Ray Laminography

Nondestructive Observation of Thermal Fatigue Crack Propagation in FBGA and Die Attached Solder Joints by Synchrotron Radiation X-Ray Laminography
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通过同步辐射 X 射线层析成像无损观察 FBGA 和芯片焊点中的热疲劳裂纹扩展

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发表时间:
2015
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通讯作者:
Toshihiko Sayama
Toshihiko Sayama
中科院分区:
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文献类型:
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作者:
Ryuta Suzuki;Souta Matsusaka;Hirofumi Hidai;Akira Chiba and Noboru Morita;川村拓史,松坂壮太,比田井洋史,千葉 明,森田 昇;Toshihiko Sayama

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