Characterization of nano-layered multilayer coatings using modified Bragg law
Characterization of nano-layered multilayer coatings using modified Bragg law
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DOI：
10.1016/j.matchar.2007.11.001
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发表时间：
2008-09
影响因子：
4.7
通讯作者：
Q. Yang;L. Zhao
中科院分区：
文献类型：
--
作者：
Q. Yang;L. Zhao
在本文中，修改后的布拉格定律是用来表征纳米层状多层涂层具有两个或四个不同的层成分的基础上测得的低角X射线衍射光谱。直接从TEM显微照片测量的调制周期的比较，并确定由修改的布拉格定律，表明低角X射线衍射技术是一种可靠的方法，在表征纳米层状多层结构。然而，修正的布拉格定律的正确应用依赖于反射峰的阶数的正确识别，这在某些情况下不是一个简单的过程。已建议采取切实可行的办法来解决这一问题。此外，本文还讨论了额外峰的出现。
In this paper, the modified Bragg law is used to characterize nano-layered multilayer coatings having two or four different layer constituents based on measured low-angle X-ray diffraction spectra. Comparisons of the modulation periods measured directly from TEM micrographs, and determined by the modified Bragg law, indicate that low-angle X-ray diffraction technique is a reliable method in characterizing nano-layered multilayer structures. However, a proper application of the modified Bragg law relies on the correct identification of the order of reflection peaks, which is not a straightforward process under certain circumstances. A practical approach has been recommended to address this issue. Furthermore, the appearance of extra peaks is discussed in this paper.