Scalable Probes of Measurement-Induced Criticality
Scalable Probes of Measurement-Induced Criticality
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DOI：
10.1103/physrevlett.125.070606
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发表时间：
2020-08-14
影响因子：
8.6
通讯作者：
Huse, David A.
中科院分区：
文献类型：
--
作者：
Gullans, Michael J.;Huse, David A.
我们发现了测量引起的相变的局部序参数：最初与系统纠缠的单个参考量子位的平均熵。使用此顺序参数，我们确定了测量引起的关键性的可扩展探针，这些探针可立即适用于先进的量子计算平台。我们在 1 + 1 维稳定器电路模型上测试我们的建议，该模型可以在多项式时间内进行经典模拟。我们引入“解码光锥”的概念来建立该探针的局部且有效可测量的性质。我们还估计了转变的体积和表面临界指数。在更通用的模型中开发测量引起的临界性的可扩展探针可能是噪声中等规模量子设备的有用应用，并且指向容错量子计算的更有效实现。
We uncover a local order parameter for measurement-induced phase transitions: the average entropy of a single reference qubit initially entangled with the system. Using this order parameter, we identify scalable probes of measurement-induced criticality that are immediately applicable to advanced quantum computing platforms. We test our proposal on a 1 + 1 dimensional stabilizer circuit model that can be classically simulated in polynomial time. We introduce the concept of a "decoding light cone" to establish the local and efficiently measurable nature of this probe. We also estimate bulk and surface critical exponents for the transition. Developing scalable probes of measurement-induced criticality in more general models may be a useful application of noisy intermediate scale quantum devices, as well as point to more efficient realizations of fault-tolerant quantum computation.