Design, Fabrication and Measurement of Pyramid-Type Antireflective Structures on Columnar Crystal Silicon Lens for Millimeter-Wave Astronomy
Design, Fabrication and Measurement of Pyramid-Type Antireflective Structures on Columnar Crystal Silicon Lens for Millimeter-Wave Astronomy
复制标题
毫米波天文柱状晶硅透镜金字塔型增透结构的设计、制作与测量
DOI:
10.1007/s10909-018-2047-4
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发表时间:
2018
影响因子:
2
通讯作者:
Nakai N.
中科院分区:
文献类型:
--
作者:
Nitta T.;Sekimoto Y.;Hasebe T.;Noda K.;Sekiguchi S.;Nagai M.;Hattori S.;Murayama Y.;Matsuo H.;Dominjon A.;Shan W.;Naruse M.;Kuno N.;Nakai N.
Pyramid-type antireflective subwavelength structures for large-diameter () silicon lenses are promising for broadband astronomical observations. The refractive index and dielectric loss tangent of the lens material, columnar crystal silicon which is manufactured by Mitsubishi Materials Electronic Chemicals Co., Ltd., were measured at around 30 K using a Martin–Puplett-type Fourier transform spectrometer. The measured refractive index and dielectric loss tangent between 200 GHz and 1.6 THz were3.42 and 1–, respectively. Three different pyramid-type structures with a period ofand depth ofwere simulated to obtain their reflectance using an electromagnetic field simulator, HFSS. The structures were fabricated on both sides of a 100-mm-diameter plane-convex lens made of columnar crystal silicon with a 150-mm radius of curvature using a metal-bonded V-shaped blade and a dedicated three-axis machine. The fabrication errors in the period and depth were less than. The reflectance of the lens flat surface was measured using a vector network analyzer to be betweenanddB in the range of 110–170 GHz, which was consistent with the result from the simulation.