A Physically-Based Reflectance Model \\ Combining Reflection and Diffraction
A Physically-Based Reflectance Model \\ Combining Reflection and Diffraction
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发表时间：
2016-10
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通讯作者：
Nicolas Holzschuch;R. Pacanowski
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作者：
Nicolas Holzschuch;R. Pacanowski
反射率属性表示虚拟场景中的对象如何与光交互；它们控制物体的外观：是否看起来有光泽，是否具有金属或塑料外观。拥有良好的反射率模型对于制作逼真的图片至关重要。测量的反射率函数提供了高真实性，但代价是内存成本。参数模型很紧凑，但找到正确的参数来近似测量的反射率可能很困难。大多数参数模型使用表面微观几何模型来预测宏观水平的反射率。在本文中，我们表明这种微观几何形状会导致{\em两个}不同的物理现象：反射和衍射。它们的相对重要性与表面粗糙度有关。考虑到这两种现象，我们开发了一种基于物理特性的紧凑的新反射率模型，并提供了测量反射率的良好近似值。
Reflectance properties express how objects in a virtual scene interact with light; they control the {\em appearance} of the object: whether it looks shiny or not, whether it has a metallic or plastic appearance. Having a good reflectance model is essential for the production of photo-realistic pictures. Measured reflectance functions provide high realism at the expense of memory cost. Parametric models are compact, but finding the right parameters to approximate measured reflectance can be difficult. Most parametric models use a model of the surface micro-geometry to predict the reflectance at the macroscopic level. In this paper, we show that this micro-geometry causes {\em two} different physical phenomena: reflection and diffraction. Their relative importance is connected to the surface roughness. Taking both phenomena into account, we develop a new reflectance model that is compact, based on physical properties and provides a good approximation of measured reflectance.