Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector.
Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector.
复制标题
通过像素化探测器获得的二元非晶材料的扫描会聚束电子衍射测量局部厚度和成分。
DOI：
10.1016/j.ultramic.2020.113077
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发表时间：
2020
期刊：
影响因子：
2.2
通讯作者：
T. Mizoguchi
中科院分区：
文献类型：
--
作者：
K. Nakazawa;K. Mitsuishi;K. Shibata;S. Amma;T. Mizoguchi
