Creating Structural Patterns for At-Speed Testing: A Case Study
Creating Structural Patterns for At-Speed Testing: A Case Study
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为实时测试创建结构模式：案例研究
DOI：
10.1109/mdt.2012.2200029
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发表时间：
2013
影响因子：
2
通讯作者：
T. McLaurin
中科院分区：
文献类型：
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作者：
T. McLaurin
速度箱（或功能频率测试）通常需要使用功能模式进行速度测试。对于成本和节点的整体覆盖，使用结构模式是一种有趣的替代方法。这项研究分析了测试频率时结构测试模式的效率。讨论了多个设备的路径延迟和过渡延迟模式的实验。作者展示了如何设计测试以及考虑哪些元素来确定最佳的结构模式类型。
Speed binning (or testing for functional frequency) often requires at-speed testing with functional patterns. Using structural patterns instead is an interesting alternative with respect to cost and overall coverage of nodes. This study analyzes the efficiency of structural test patterns when testing for frequency. Experiments with both path delay and transition delay patterns are discussed for multiple devices. The author shows how the tests are designed and what elements are taken into account to determine the best type of structural patterns.