Polarization-Dependent Total-Reflection Fluorescence XAFS Study of Mo Oxides on a Rutile TiO2(110) Single Crystal Surface
Polarization-Dependent Total-Reflection Fluorescence XAFS Study of Mo Oxides on a Rutile TiO2(110) Single Crystal Surface
复制标题
金红石 TiO2(110) 单晶表面上 Mo 氧化物的偏振相关全反射荧光 XAFS 研究
DOI:
10.1021/jp9820368
复制
发表时间:
1998
影响因子:
3.3
通讯作者:
Y. Iwasawa
中科院分区:
文献类型:
--
作者:
W. Chun;K. Asakura;Y. Iwasawa
The structure of well-dispersed Mo oxides on TiO2(110) was investigated by means of polarization-dependent total-reflection fluorescence X-ray absorption fine structure (PTRF-EXAFS) in three different directions of the single-crystal surface. A model sample for supported Mo oxide catalysts was prepared by impregnation of (NH4)6Mo7O24·4H2O dissolved in ultrapure water, followed by calcination at 773 K. Direct comparison of the observed EXAFS and the calculated one was performed based on three-dimensional model structures. We found that anisotropic Mo dimers were preferentially formed on the TiO2(110) surface, with Mo−Mo distance (0.335 nm) parallel to the [110] direction of the surface. It was also found that the Mo dimers were attached to the surface, showing Mo−Ti (interfacial) distance at 0.296 nm.