X-ray microtomography and statistical analysis: Tools to quantitatively classify bread microstructure
X-ray microtomography and statistical analysis: Tools to quantitatively classify bread microstructure
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DOI：
10.1016/j.jfoodeng.2013.10.002
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发表时间：
2014-03-01
影响因子：
5.5
通讯作者：
Del Nobile, M. A.
中科院分区：
文献类型：
--
作者：
Cafarelli, Barbara;Spada, Alessia;Del Nobile, M. A.
在这项研究中，选择了物理结构明显不同的五种不同类型的意大利面包样品，进行了X射线显微断层扫描分析。通过数据分析得到了面包样品的平均微观结构参数和个体微观结构参数。在数据分析之后，应用先进的统计分析方法对所获得的显微断层扫描数据进行定量分类。这项工作的结果表明，X射线显微断层成像与综合统计方法相结合，不仅提供了被调查产品的重要微观结构信息，而且还能够根据样品中存在的物体的平均或个别微结构特性将这些产品分类为特定的组类型。(C)2013爱思唯尔有限公司。保留所有权利。
In this study, five different types of Italian bread samples chosen for their visible differences in physical structure were analysed by X-ray microtomographical analysis. The average and individual object microstructural parameters of the bread samples were obtained from data analysis. Following data analysis, the application of advanced statistic analysis to the obtained microtomographical data was used to quantitatively classify the different bread types in this study. The results of this work show that X-ray microtomography combined with an integrated statistical approach does not only provide important microstructural information of the product under investigation but is also able to classify these products into specific group types based on the average or individual microstructural properties of the objects present in the sample. (C) 2013 Elsevier Ltd. All rights reserved.