Static Vapor Pressure Measurement of Low Volatility Precursors for Molecular Vapor Deposition Below Ambient Temperature
Static Vapor Pressure Measurement of Low Volatility Precursors for Molecular Vapor Deposition Below Ambient Temperature
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DOI:
10.1002/1521-3862(200101)7:1
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发表时间:
2001
影响因子:
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通讯作者:
T. Ohta;F. Cicoira;P. Doppelt;L. Beitone;P. Hoffmann
中科院分区:
文献类型:
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作者:
T. Ohta;F. Cicoira;P. Doppelt;L. Beitone;P. Hoffmann
Keywords: [NRG] Note: \\Atlantis\MAD\MAD public\Publi Present Conferences\Publications\printed papers\2001 : NRG Ohta 2001 115 Reference LOA-ARTICLE-2001-016doi:10.1002/1521-3862(200101)7:1 3.0.CO;2-Y Record created on 2009-07-20, modified on 2017-05-10