Very low energy electron microscopy of graphene flakes
Very low energy electron microscopy of graphene flakes
复制标题
石墨烯薄片的极低能电子显微镜
DOI：
10.1111/jmi.12049
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发表时间：
2013
影响因子：
2
通讯作者：
L. Frank
中科院分区：
文献类型：
--
作者：
E. Mikmeková;H. Bouyanfif;M. Lejeune;I. Müllerová;M. Hovorka;M. Uncovsky;L. Frank
通过拉曼光谱和极低能量扫描透射电子显微镜检查市售石墨烯样品。拉曼光谱的有限横向分辨率可产生对应于单个石墨烯层的拉曼光谱，即使对于可通过极低能量电子显微镜识别为各种厚度的较小薄片的聚集体的薄片也是如此。除了在较大尺寸下对石墨烯样品进行诊断外，还可以在非常低的能量下测量它们的电子透射率。
Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.