Thermal analysis and design of GaN‐based LEDs for high power applications
Thermal analysis and design of GaN‐based LEDs for high power applications
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DOI:
10.1002/pssc.200303466
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发表时间:
2003-12
期刊:
影响因子:
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通讯作者:
L. Kim;G. W. Lee;W. Hwang;J. Yang;M. Shin
中科院分区:
文献类型:
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作者:
L. Kim;G. W. Lee;W. Hwang;J. Yang;M. Shin
In this paper, a thermal analysis was made on blue and white GaN-based LEDs. The thermal analysis consists of experimental temperature measurements and finite element calculations on the LED chips and surface of epoxy package. The direct on-chip temperature measurement using a nematic liquid crystal resulted in a hot spot with a transition boundary of 43 °C in a range of about 450 to 500 μm under a forward voltage of 3.9 V. The surface temperature of the epoxy package was measured as a function of input power and it exhibits a linear relationship. The finite element method was used for the calculation of temperature distributions for samples and the simulated data showed good agreement with the experimental results. (© 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)