Smoothing and coherent structure formation in organic-organic heterostructure growth

Smoothing and coherent structure formation in organic-organic heterostructure growth
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有机-有机异质结构生长中的平滑和相干结构形成

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发表时间:
2010
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通讯作者:
F. Schreiber
F. Schreiber
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作者:
A. Hinderhofer;A. Gerlach;S. Kowarik;F. Zontone;J. Krug;F. Schreiber

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我们使用原位实时X射线反射率和互补原子力显微镜来监测有机异质结构生长过程中的结晶度和粗糙度演变,即二并二茚(DIP)上的全氟并五苯(PFP)和PFP上的并五苯(PEN)。对于这两种系统,在第一材料的顶部上的第二材料的热蒸发期间观察到表面平滑。与同质外延相比,平滑可以通过降低一种物质在另一种上扩散的台阶边缘势垒来合理化。此外,我们发现一个非常有序的界面PEN上的PFP的增长和PEN增长的低粗糙度,沿着与相干散射在整个厚度。
We use in situ real-time X-ray reflectivity and complementary atomic force microscopy to monitor crystallinity and roughness evolution during growth of organic heterostructures, i.e. perfluoropentacene (PFP) on diindenoperylene (DIP) and pentacene (PEN) on PFP. For both systems, surface smoothing during thermal evaporation of the second material on top of the first is observed. The smoothing can be rationalized by a, compared to homoepitaxy, lowered step edge barrier for one species diffusing on the other. In addition, we find an exceptionally well-ordered interface for PEN-on-PFP growth and PEN growth with anomalously low roughening, along with coherent scattering over the entire thickness.