Dielectric behaviour of plasma hydrogenated TiO2/cyanoethylated cellulose nanocomposites.
Dielectric behaviour of plasma hydrogenated TiO2/cyanoethylated cellulose nanocomposites.
复制标题
等离子体氢化 TiO2/氰乙基化纤维素纳米复合材料的介电行为。
DOI：
10.1039/d2nr04680f
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发表时间：
2023
期刊：
影响因子：
6.7
通讯作者：
Adassooriya NM
中科院分区：
文献类型：
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作者：
Adassooriya NM
聚合物与纳米颗粒之间的界面对介电聚合物纳米复合材料的整体介电性能起着至关重要的作用。在本研究中，成功制备了一种新型的介电纳米复合材料，该复合材料包含高介电常数聚合物、氰乙基化纤维素（CRS）和表面经过氢等离子体处理修饰的TiO2纳米颗粒，其氢化TiO2的重量百分比分别为10%、20%和30%。分析了H等离子体处理的纳米TiO2 （H-TiO2）的内部结构、分子间相互作用和聚合物纳米复合材料的形态。采用H-TiO2/CRS薄膜在SiO2/Si晶片上制备金属-绝缘子-金属（MIM）型电容器。测量了1 kHz ~ 1 MHz频率范围内的电容和损耗因子。在1 kHz时，氢化TiO2质量为10%、20%和30%的H-TiO2/CRS纳米复合材料的介电常数分别为80、118和131，显著高于纯CRS（21）和TiO2（41）。此外，所有三种H-TiO2 /CRS纳米复合材料在1 kHz时的损耗因子<0.3，漏电流密度（10−6 a cm−2 - 10−7 a cm−2）均较低。利用导电原子力显微镜（C-AFM）研究了泄漏，发现泄漏与嵌入在CRS聚合物基体中的H-TiO2纳米颗粒有关。虽然与原始TiO2/CRS体系相比，修改后的界面稍微降低了能量密度，但H-TiO2/CRS在−2 V至2 V电压范围内的电容值非常稳定。虽然H-TiO2/CRS具有超高介电常数（bbb100），但本研究表明，聚合物纳米颗粒界面对复合材料的介电行为有潜在的影响。
The interface between the polymer and nanoparticle has a vital role in determining the overall dielectric properties of a dielectric polymer nanocomposite. In this study, a novel dielectric nanocomposite containing a high permittivity polymer, cyanoethylated cellulose (CRS) and TiO2 nanoparticles surface modified by hydrogen plasma treatments was successfully prepared with different weight percentages (10%, 20% and 30%) of hydrogenated TiO2. Internal structure of H plasma treated TiO2 nanoparticles (H-TiO2) and the intermolecular interactions and morphology within the polymer nanocomposites were analysed. H-TiO2/CRS thin films on SiO2/Si wafers were used to form metal–insulator–metal (MIM) type capacitors. Capacitances and loss factors in the frequency range of 1 kHz to 1 MHz were measured. At 1 kHz H-TiO2/CRS nanocomposites exhibited ultra-high dielectric constants of 80, 118 and 131 for nanocomposites with 10%, 20% and 30% weight of hydrogenated TiO2 respectively, significantly higher than values of pure CRS (21) and TiO2 (41). Furthermore, all three H-TiO2 /CRS nanocomposites show a loss factor <0.3 at 1 kHz and low leakage current densities (10−6 A cm−2–10−7 A cm−2). Leakage was studied using conductive atomic force microscopy (C-AFM) and it was observed that the leakage is associated with H-TiO2 nanoparticles embedded in the CRS polymer matrix. Although, modified interface slightly reduces energy densities compared to pristine TiO2/CRS system, the capacitance values for H-TiO2/CRS-in the voltage range of −2 V to 2 V are very stable. Whilst H-TiO2/CRS possesses ultra-high dielectric constants (>100), this study reveals that the polymer nanoparticle interface has a potential influence on dielectric behaviour of the composite.