Relationship between film thickness and the critical current of YBa2Cu3O7-δ-coated conductors
Relationship between film thickness and the critical current of YBa2Cu3O7-δ-coated conductors
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DOI：
10.1063/1.125431
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发表时间：
1999-12-06
影响因子：
4
通讯作者：
Smith, JF
中科院分区：
文献类型：
--
作者：
Foltyn, SR;Jia, QX;Smith, JF
在柔性金属带上的YBa 2 Cu 3 O 7-δ（YBCO）涂层的开发过程中，已经变得明显的是，在涂层厚度为1-2 μ m时，可获得的临界电流（I-c）达到约200 A/cm导体宽度的最大值。超过该厚度的额外YBCO实际上可以降低I-c。为了研究，临界电流密度（J（c））已被测量的样品与YBCO范围从0.39至6.3 μ m的厚度。几个薄膜变薄的离子铣削和重新测量有两个显着的结果：几乎没有超电流进行2 μ m以上的厚度水平;和膜厚超过3 μ m，J（c）是急剧减少的基板附近以及。(C)1999年美国物理学会。[S0003-6951（99）04249-7]。
During the development of YBa2Cu3O7-delta (YBCO) coatings on flexible metal tapes, it has become evident that the achievable critical current (I-c) reaches a maximum value of about 200 A per cm of conductor width at a coating thickness of 1-2 mu m. Additional YBCO beyond this thickness can actually reduce I-c. To investigate, critical current density (J(c)) has been measured for samples with YBCO ranging from 0.39 to 6.3 mu m in thickness. Several films were thinned by ion milling and remeasured with two significant results: almost no supercurrent is carried at thickness levels above 2 mu m; and for films thicker than 3 mu m, J(c) is drastically reduced near the substrate as well. (C) 1999 American Institute of Physics. [S0003-6951(99)04249-7].