Exciton-L0 Phonon Scattering in Cu2O
Exciton-L0 Phonon Scattering in Cu2O
复制标题
Cu2O 中的激子-L0 声子散射
DOI：
10.1143/jpsj.36.753
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发表时间：
1974
影响因子：
1.7
通讯作者：
T. Anzai
中科院分区：
文献类型：
--
作者：
K. Shindō;T. Goto;T. Anzai
用大色散的单色仪在1.8 K下，用光电法测量了Cu 2o中黄色激子系列中几个较高成员的可靠吸收谱线形状，并根据Toyozawa公式进行了分析。半宽度的来源被认为是激子在L0声子的两种模式下从p态向1s态的带间散射。估计的激子序列第n个成员与第2个成员的线宽比与实验结果一致。
Reliable absorption line shape of the several higher members of the yellow exciton series in Cu 2 O has been measured by the photoelectric method using a monochromator with a large dispersion at 1.8 K, and has been analyzed on the basis of Toyozawa's formula. The origin of the half width is considered to come from the interband scattering of the exciton from the p state to the 1 s state by the two modes of L0 phonons. The estimated ratio in the line width of the n -th member to the second member of the exciton series is in agreement with the experimental one.