14C AMS Measurements of <100 μG Samples with a High-Current System
14C AMS Measurements of <100 μG Samples with a High-Current System
复制标题
使用高电流系统对 <100 μG 样品进行 14C AMS 测量
DOI：
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发表时间：
1997
期刊：
影响因子：
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通讯作者：
R. Schneider
中科院分区：
文献类型：
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作者：
K. F. von Reden;A. McNichol;A. Pearson;R. Schneider
伍兹霍尔海洋学研究所的NOSAMS设施已开始开发和应用技术，用于在标准的串列加速器质谱仪（AMS）系统上测量非常小的样品，该系统具有高电流半球形Cs溅射离子源。在过去一年中，从7到160微克碳的样品的结果显示了这种分析的可行性和目前减少固体碳样品尺寸的局限性。影响AMS结果的主要因素之一是一些束光学参数对提取的离子束电流的依赖性。对于上述样本量，提取的12C−电流范围为0.5至10 μA。本文讨论了AMS系统的建立和可靠的小样本测量方法，并给出了与AMS相关的样本容量限值和测量不确定度。
The NOSAMS facility at Woods Hole Oceanographic Institution has started to develop and apply techniques for measuring very small samples on a standard Tandetron accelerator mass spectrometry (AMS) system with high-current hemispherical Cs sputter ion sources. Over the past year, results on samples ranging from 7 to 160 μg C showed both the feasibility of such analyses and the present limitations on reducing the size of solid carbon samples. One of the main factors affecting the AMS results is the dependence of a number of the beam optics parameters on the extracted ion beam current. The extracted currents range from 0.5 to 10 μA of 12C− for the sample sizes given above. We here discuss the setup of the AMS system and methods for reliable small-sample measurements and give the AMS-related limits to sample size and the measurement uncertainties.