Study on Resonance Phenomenon Caused by Voltage Fluctuation of Power Supply in JT-60SA EF Coil
Study on Resonance Phenomenon Caused by Voltage Fluctuation of Power Supply in JT-60SA EF Coil
复制标题
JT-60SA EF线圈电源电压波动引起的谐振现象研究
DOI：
10.1109/tasc.2023.3250379
复制
发表时间：
2023
影响因子：
1.8
通讯作者：
Shimada Katsuhiro
中科院分区：
文献类型：
--
作者：
Sonoda Shogo;Nakamura Kazuya;Yuinawa Kotomi;Kobayashi Tomoka;Murakami Haruyuki;Hamada Kazuya;Hatakeyama Shoichi;Shimada Katsuhiro
对于大型研究托卡马克JT-60 SA，评估导体之间的耐受电压是线圈设计的最关键因素之一。供给线圈的电源注入宽频谱的频率分量。瞬态响应和谐振现象引起线圈中的非均匀电压分布。瞬时集中电压会引起导体间绝缘击穿，JT-60 SA可能无法安全运行。本研究进行了脉冲测试，以评估平衡场（EF）线圈相邻导体之间的耐受电压。测量EF线圈的实际电源电压，以研究斜坡率（dv/dt）和频谱。此外，基于EF虚拟线圈的谐振测试的结果，开发了EF线圈的电路仿真模型，以评估瞬态响应和谐振现象对线圈中的电压的影响。本研究的结果提供了基本数据，可用于确保EF线圈不会导致绝缘击穿。
For the large research Tokamak JT-60SA, evaluating the withstand voltage between conductors is one of the most critical factors for the coil design. The power supply feeding the coil injects a wide spectrum of frequency components. The transient response and resonance phenomena induce a non-uniform voltage distribution in the coil. The transiently concentrated voltage can cause the insulation breakdown between conductors, and JT-60SA may not be able to operate safely. This study conducted an impulse test to evaluate the withstand voltage between adjacent conductors for an equilibrium field (EF) coil. The actual power supply voltage for the EF coil was measured to investigate the ramp rate (dv/dt) and frequency spectrum. In addition, based on the results of a resonance test of the EF dummy coil, a circuit simulation model for the EF coil was developed to evaluate the effect of the transient response and resonance phenomenon on the voltage in the coil. The results of this study provide fundamental data that can be used to ensure that the EF coil does not cause insulation breakdown.