Low-Temperature Scanning Tunneling Microscopy and Transport Measurements on Adsorbate-Induced Two-Dimensional Electron Systems

Low-Temperature Scanning Tunneling Microscopy and Transport Measurements on Adsorbate-Induced Two-Dimensional Electron Systems
复制标题

吸附物诱导二维电子系统的低温扫描隧道显微镜和输运测量

DOI:
10.1063/1.4848400
复制
发表时间:
2013
期刊:
AIP Conference Proceedings
影响因子:
--
通讯作者:
T. Okamoto
T. Okamoto
中科院分区:
--
文献类型:
--
作者:
R. Masutomi;N. Toriyama;T. Okamoto

文献摘要

相似文献