Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution
Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution
复制标题
二维硅膜阳极的失效机制：裂纹演化的原位观察和模拟
DOI：
10.1039/c7cc09708e
复制
发表时间：
2018
影响因子：
4.9
通讯作者：
Dai-Ning Fang
中科院分区：
文献类型：
--
作者：
Le Yang;Hao-Sen Chen;Hanqing Jiang;Yu-Jie Wei;Wei-Li Song;Dai-Ning Fang
利用原位光学系统观察了二维硅膜阳极的破坏过程，提出了一种基于裂纹破碎的新剥离模式。通过完全耦合的有限元模拟定量分析了锂化时的应力演化，证实了2D硅阳极中的裂纹破碎引起的失效机制。
An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.