Effect of neutral and charged particles on the line shape of the 577 and 491.6 nm mercury lines: Application to mercury pressure determination in high‐pressure Hg lamps
Effect of neutral and charged particles on the line shape of the 577 and 491.6 nm mercury lines: Application to mercury pressure determination in high‐pressure Hg lamps
复制标题
中性和带电粒子对 577 和 491.6 nm 汞线线形的影响：在高压汞灯中汞压力测定中的应用
DOI：
10.1063/1.350664
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发表时间：
1992
影响因子：
3.2
通讯作者：
J. Salon
中科院分区：
文献类型：
--
作者：
A. Asselman;M. Aubès;J. Damelincourt;J. Salon
研究了在50 Hz交流频率下工作的高压汞放电中发射的光学薄Hg 577和491.6 nm谱线的展宽和位移。进行了调查，以了解不同的因素对局部线轮廓的加宽和移位的影响。计算和实验表观线形之间的比较允许确定一组加宽和移位参数，这导致令人满意的线形表示。此外，汞放电诊断的应用提出。
The broadening and shift of the optically thin Hg 577 and 491.6 nm lines emitted in high‐pressure mercury discharges operating at 50 Hz ac frequency are studied. An investigation is carried out in order to appreciate the influence of different factors on the broadening and shift of the local line profile. Comparison between computed and experimental apparent line shapes permits the determination of a set of broadening and shift parameters which leads to a satisfactory representation of the line shapes. Furthermore, applications to mercury discharge diagnosis are proposed.