Evaluation of the enamel etching capacity of six contemporary self-etching adhesives
Evaluation of the enamel etching capacity of six contemporary self-etching adhesives
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DOI：
10.1016/j.jdent.2006.11.003
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发表时间：
2007-05-01
影响因子：
4.4
通讯作者：
Ahmed, Yasin
中科院分区：
文献类型：
--
作者：
Gregoire, Genevieve;Ahmed, Yasin
目的：本研究的目的是评估能力的6个当代自酸蚀底漆/胶粘剂dernineralize地面釉质蚀刻表面的超微结构分析的扫描电镜下，并通过光谱测量的钙和磷酸盐离子solved.Methods的百分比：70个非龋提取的人第三磨牙被细分为2组35颗牙齿。研磨第一组的牙齿，使其暴露出3-4 mm厚的平坦、抛光的釉质表面。用六种自蚀刻粘结系统和磷酸凝胶（对照组）处理由此获得的样品。然后去除自酸蚀底漆，并通过SEM观察蚀刻的釉质表面。从第二组的牙齿，盘形标本由研磨的釉质制成，并进行应用程序的六个自蚀刻剂。一旦蚀刻产品已被冲洗掉，冲洗液进行了分析，通过原子火焰光谱法，以评估钙和磷酸根离子的百分比solved.Results：SEM图像显示，AdheSE，Adper Prompt L-Pop和Xeno III，尽管具有较低的强度比磷酸蚀刻功效，给出了一个规则的图案在相当大的表面积和深度。iBond和One-Up Bond F的脱矿规律性较差。对于Clearfil SE Bond，脱矿作用无效。矿物损失百分比的结果表明，Adper Prompt L-Pop和Xeno III是最有效的自蚀刻产品。AdhesSE、iBond和One-Up Bond F分别表现出降低的去矿物质能力。Clearfil SE债券，但是，给低比例的钙和磷酸根离子的损失，被认为是unsatisfactory.Conclusion：对牙釉质的行动是不一样的所有自酸蚀系统测试。自蚀刻粘合剂的蚀刻电位低于磷酸的蚀刻电位，但一些自蚀刻系统，特别是具有含有磷酸盐衍生物的单体的那些自蚀刻系统，得到的结果接近于用磷酸获得的结果。(c)2006爱思唯尔有限公司保留所有权利。
Objectives: The purpose of this study was to evaluate the capacity of six contemporary self-etch primers/adhesives to dernineralize ground enamel by means of ultrastructural analysis of the etching surface under SEM and by spectroscopic measurement of the percentage of calcium and phosphate ions dissolved.Methods: Seventy non-carious extracted human third molars were sub-divided into 2 groups of 35 teeth each. The teeth of the first group were ground to expose flat, polished enamel surfaces 3-4 mm thick. The samples thus obtained were treated with six self-etch bonding systems and a phosphoric acid gel (control group). The self-etch priming agent was then eliminated and the etched enamel surface observed by SEM. From the teeth of the second group, disc-shaped specimens were made from ground enamel and subjected to application of each of the six self-etchants. Once the etching product had been rinsed off, the rinse solution was analyzed by atomic flame spectroscopy to evaluate the percentage of calcium and phosphate ions dissolved.Results: SEM images show that AdheSE, Adper Prompt L-Pop and Xeno III, despite having a less intensive etching efficacy than phosphoric acid, gave a regular pattern over a considerable surface area and depth. iBond and One-Up Bond F gave less regular demineralization. For Clearfil SE Bond, the demineralization was ineffective. Results of the percentage of mineral loss show that Adper Prompt L-Pop and Xeno III were the most efficient self-etch products. AdheSE, iBond and One-Up Bond F, respectively exhibited decreasing demineralizing capacity. Clearfil SE Bond, however, gave low proportions of calcium and phosphate ions loss and was considered unsatisfactory.Conclusion: The action on enamel was not the same for all self-etch systems tested. The etching potential of the self-etch adhesives was lower than that of phosphoric acid but some self-etch systems, particularly those with monomers containing phosphate derivatives, gave results close to those obtained with phosphoric acid. (c) 2006 Elsevier Ltd. All rights reserved.