XSENSOR technology: a pressure imaging overview
XSENSOR technology: a pressure imaging overview
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DOI:
10.1108/02602280710723433
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发表时间:
2007-01-01
期刊:
影响因子:
1.6
通讯作者:
Cork, Russell
中科院分区:
文献类型:
--
作者:
Cork, Russell
Purpose - The paper aims to present an innovative method for imaging the pressure distribution between two interface surfaces. The physical principles behind the design of the pressure imaging system are explained, and some case studies involving the use of this technology in diverse applications are described.Design/methodology/approach - The XSENSOR pressure sensor is comprised of a matrix of capacitive sensing elements. Pressure applied to the surface of the sensing element causes a change in capacitance that is correlated to a change in pressure. Proprietary Windows based software compensates for sensor non-linearity, hysteresis, and creep over time, resulting in enhanced accuracy.Findings - XSENSOR's capacitive based pressure imaging sensors can graphically display pressure distributions in real time between virtually any two surfaces in contact. The sensor element is accurate, thin, flexible, and robust. These physical characteristics minimize any artificial influences created by the presence of the sensor during data collection.Practical implications - Pressure imaging technology can be used in industrial and engineering environments for product design and verification, process control, or quality assurance.Originality/value - This paper will be useful to the engineer or business manager interested in applying sensor technology to solve engineering or design problems.