In Situ Nanoindentation and Scratch Testing Inside Scanning Electron Microscopes: Opportunities and Challenges
In Situ Nanoindentation and Scratch Testing Inside Scanning Electron Microscopes: Opportunities and Challenges
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扫描电子显微镜内的原位纳米压痕和划痕测试:机遇和挑战
DOI:
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发表时间:
2014
期刊:
影响因子:
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通讯作者:
Hongwei Zhao
中科院分区:
文献类型:
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作者:
Hu Huang;Hongwei Zhao