Evaluation of surface roughness of metal films using plasmonic Fano resonance in attenuated total reflection
Evaluation of surface roughness of metal films using plasmonic Fano resonance in attenuated total reflection
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使用衰减全反射中的等离子体法诺共振评估金属薄膜的表面粗糙度
DOI：
10.1103/physrevb.101.085414
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发表时间：
2020
影响因子：
3.7
通讯作者：
Kadoya Yutaka
中科院分区：
文献类型：
--
作者：
Nishida Munehiro;Matsumoto Taisei;Koga Hiroya;Kosako Terukazu;Kadoya Yutaka
表面等离子体激元 (SPP) 的衰减全反射 (ATR) 是一种从反射光谱中的凹陷位置评估 SPP 色散关系的方法。然而，最近的研究表明，这些凹陷是从SPP共振中取代的，因为它们是由一种法诺共振产生的，即伴随SPP共振激励的共振反射过程与没有共振激励的直接反射过程之间的干扰。这一结果表明，SPP 色散关系中难以实现的系统特性可以使用 ATR 方法来表征。在这项研究中，我们从法诺共振的角度研究了点蚀初始阶段产生的纳米级凹坑所导致的表面粗糙度对 ATR 光谱的影响。使用时间耦合模式方法表明，ATR 中的法诺共振是由金属表面吸收导致的直接反射相位变化引起的，并且光谱形状由该相位以及外部（辐射）衰减率与共振模式总衰减率的比率决定。此外，还表明从 ATR 光谱中提取的内部和外部衰减率可提供有关腐蚀的信息，例如金属膜的有效厚度和凹坑分布的随机性。
Attenuated total reflection (ATR) by surface plasmon polariton (SPP) is a method for evaluating the dispersion relation of SPP from the position of a dip in the reflection spectrum. However, recent studies have shown that the dips are displaced from SPP resonance because they are produced by a type of Fano resonance, i.e., the interference between the resonant reflection process accompanied by resonant excitation of SPP and the direct reflection process without resonant excitation. This result suggests that the system properties difficult to be achieved in the dispersion relation of SPP can be characterized using the ATR method. In this study, we investigate the effect of surface roughness due to nanosized dimples created in the initial stage of pitting corrosion on the ATR spectrum, from the viewpoint of Fano resonance. Using the temporal coupled-mode method, it is shown that the Fano resonance in ATR is caused by the phase change of direct reflection because of the absorption on the metal surface, and the spectral shape is determined by this phase, along with the ratio of the external (radiative) decay rate to the total decay rate of the resonant mode. Moreover, it is clarified that the internal and external decay rates extracted from the ATR spectrum provide information on corrosion, such as the effective thickness of the metal film and the randomness in dimple distribution.
DOI：
10.1002/pssb.2220760209
发表时间：
1976-01-01
期刊：
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
影响因子：
--
作者：
KROGER, E;KRETSCHMANN, E
通讯作者：
KRETSCHMANN, E
影响因子：
2.4
作者：
Agarwal, Sajal;Prajapati, Y. K.;Singh, V.
通讯作者：
Singh, V.
不同底层对蒸镀银膜表面粗糙度的影响
影响因子：
1.9
作者：
R. Orlowski;P. Urner;D. Hornauer
通讯作者：
D. Hornauer