Experimental results of photothermal microstructural depth profiling
Experimental results of photothermal microstructural depth profiling
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DOI：
10.1063/1.359869
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发表时间：
1995-09
影响因子：
3.2
通讯作者：
T. Lan;U. Seidel;H. Walther;G. Goch;B. Schmitz
中科院分区：
文献类型：
--
作者：
T. Lan;U. Seidel;H. Walther;G. Goch;B. Schmitz
给出了表面硬化钢和机械加载陶瓷的热导率深度分布的实验结果，基于热导率的分段线性不均匀深度分布的样品的反演算法。光热获得的配置文件进行解释或与传统的或破坏性的测量技术的结果进行比较。
Experimental results of thermal conductivity depth profiling of case‐hardened steel and mechanically loaded ceramics are presented, based on an inversion algorithm for a sample with piecewise linearly inhomogeneous depth profile of the thermal conductivity. The photothermally obtained profiles are interpreted or compared with results from conventional or destructive measuring techniques.