Terahertz Frequency Metrology Based on Frequency Comb

Terahertz Frequency Metrology Based on Frequency Comb
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DOI:
10.1109/jstqe.2010.2047099
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发表时间:
2011
影响因子:
4.9
通讯作者:
T. Yasui;S. Yokoyama;H. Inaba;K. Minoshima;T. Nagatsuma;T. Araki
T. Yasui;S. Yokoyama;H. Inaba;K. Minoshima;T. Nagatsuma;T. Araki
中科院分区:
工程技术2区
文献类型:
--
作者:
T. Yasui;S. Yokoyama;H. Inaba;K. Minoshima;T. Nagatsuma;T. Araki

文献摘要

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回顾了两种基于频率梳的太赫兹(THz)频率计量技术,即太赫兹梳参考频谱分析仪和连续可调、单频连续波(CW)-太赫兹发生器。由于频率梳能够将微波、光学和太赫兹区域之间的频率相干地链接起来,因此可以建立可追溯到 SI 基本单元时间的太赫兹频率计量。使用基于用于太赫兹检测的光电导天线中生成的稳定太赫兹梳的太赫兹梳参考频谱分析仪,以10-11的精度确定了亚太赫兹和太赫兹区域中的CW测试源的绝对频率。此外,通过将精确可调谐连续激光器和光频率区域内紧密固定的连续激光器进行光混合,在 120 GHz 附近演示了连续可调谐、单频 CW-THz 发生器,锁相到两个独立的光梳。 CW-THz发生器与太赫兹梳参考频谱分析仪的结合将为在太赫兹区域建立频率计量打开大门。
Two techniques for terahertz (THz) frequency metrology based on frequency comb, namely, a THz-comb-referenced spectrum analyzer and a continuously tunable, single-frequency continuous-wave (CW)-THz generator, are reviewed. Since the frequency comb enables to coherently link the frequency among microwave, optical, and THz regions, it is possible to establish the THz frequency metrology traceable to time of the SI base units. Using a THz-comb-referenced spectrum analyzer based on a stable THz comb generated in a photoconductive antenna for THz detection, the absolute frequency of CW test sources in the sub-THz and THz regions was determined at a precision of 10-11. Furthermore, a continuously tunable, single-frequency CW-THz generator was demonstrated around 120 GHz by photomixing of an accurately tunable CW laser and a tightly fixed CW laser in the optical frequency region, phase locked to two independent optical combs. The combination of the CW-THz generator with the THz-comb-referenced spectrum analyzer will open the door for establishment of frequency metrology in the THz region.