Dependence of magnetic properties on magnetic layer thickness in SmCo/Cr films
Dependence of magnetic properties on magnetic layer thickness in SmCo/Cr films
复制标题
SmCo/Cr 薄膜中磁性能对磁性层厚度的依赖性
DOI：
10.1063/1.370024
复制
发表时间：
1999
影响因子：
3.2
通讯作者：
M. Matsumoto
中科院分区：
文献类型：
--
作者：
S. Takei;Yoshihiro Otagiri;A. Morisako;M. Matsumoto
制备了SmCo层厚度为1~400 nm的SmCo/Cr薄膜，研究了SmCo层厚度对薄膜磁性能的影响。原子力显微镜(AFM)测量表明，铬底层和SmCo/Cr膜的表面形貌非常相似，对于厚度小于100 nm的SmCo层，表面粗糙度(Ra)约为6 nm。铬底层有助于形成细小的晶粒和光滑的表面，改善了SmCo层的磁性能。当SmCo层厚度为40 nm时，最大矫直力约为3.3kOe，平面方向的方度和矫直方度分别为0.91和0.97。由磁开关体积估算的开关单元直径小于30 nm，而AFM观察到的颗粒尺寸为50 nm或更大。SmCo/Cr双层膜的磁性和微结构有望满足高密度记录介质的要求。
SmCo/Cr films were prepared with the thickness of SmCo layer varying from 1 to 400 nm, and the dependence of the magnetic properties on SmCo layer thickness was studied. Atomic force microscopy (AFM) measurement revealed that both the Cr underlayer and SmCo/Cr films were very similar in surface morphology with the surface roughness (Ra) of about 6 nm for the SmCo layer thinner than 100 nm. The Cr underlayer contributes to generate small grain size and smooth surface for SmCo layer as well as to improve its magnetic properties. The maximum coercivity was about 3.3 kOe, and the squareness and the coercive squareness in the plane direction were about 0.91 and 0.97, respectively, when the SmCo layer thickness was 40 nm. The diameter of switching unit estimated by the magnetic switching volume was smaller than 30 nm, while AFM observations show a grain size of 50 nm or more. The magnetic properties and the microstructure of SmCo/Cr bilayer films promise to be suitable for high density recording media applications.