Spectroscopy of diagnostic x rays by a Compton-scatter method.
Spectroscopy of diagnostic x rays by a Compton-scatter method.
复制标题
DOI：
10.1118/1.594263
复制
发表时间：
1976-09
期刊：
影响因子：
3.8
通讯作者：
Michael B. Yaffe;Michael B. Yaffe;Michael B. Yaffe;Kenneth W. Taylor;Kenneth W. Taylor;Kenneth W. Taylor;H. E. Johns;H. E. Johns;H. E. Johns
中科院分区：
文献类型：
--
作者：
Michael B. Yaffe;Michael B. Yaffe;Michael B. Yaffe;Kenneth W. Taylor;Kenneth W. Taylor;Kenneth W. Taylor;H. E. Johns;H. E. Johns;H. E. Johns
描述了一种使用高分辨率本征锗能谱仪测量诊断 X 射线能谱的方法。该方法适用于放射线照相中通常使用的各种 X 射线曝光率。通过测量由透明玻璃盘散射 90 度的光子光谱，可将高 X 射线束强度降低至锗能谱仪可接受的水平。根据该测量光谱，通过计算获得主光谱。给出了一些典型的 X 射线光谱。
A method is described for measuring the energy spectra of diagnostic x rays using a high-resolution intrinsic germanium spectrometer. The method is applicable over the wide range of x-ray exposure rates normally used in radiography. Reduction of the high x-ray beam intensity to a level acceptable to the germanium spectrometer is achieved by measuring the spectrum of photons scattered through 90 degrees by a lucite disc. From this measured spectrum the primary spectrum is obtained by calculation. Some typical x-ray spectra are presented.