Characteristic Resistive Switching of Rare-Earth Oxyhydrides by Hydride Ion Insertion and Extraction
Characteristic Resistive Switching of Rare-Earth Oxyhydrides by Hydride Ion Insertion and Extraction
复制标题
通过氢阴离子插入和脱嵌实现稀土氢氧化物的特性电阻开关
DOI:
10.1021/acsami.2c03483
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发表时间:
2022
影响因子:
9.5
通讯作者:
and Hideo Hosono
中科院分区:
文献类型:
--
作者:
Tomoyuki Yamasaki;Ryosei Takaoka;Soshi Iimura;Junghwan Kim;Hidenori Hiramatsu;and Hideo Hosono
Resistive switching induced by ion migration is promising for applications such as random-access memory (ReRAM) and neuromorphic transistors. Hydride ions (H–) are an interesting candidate as the migration ion for resistive switching devices because they have fast diffusion in several compounds at room temperature and doping/dedoping can be used effectively to achieve significant changes in the electronic conductivity. Here, we report reversible resistive switching characteristics in rare-earth oxyhydrides (REHxO(3–x)/2) induced by field insertion/extraction of H–. The current–voltage measurements revealed that the resistive switching response, hysteresis, and switching voltage vary greatly with the H–/O2–ratio in the films. We fabricated a ReRAM device using Ti/YH1.3O0.85/MoOxstructure and confirmed the bipolar-type operation with the resistance switching ratio of 1 order of magnitude over 1000 cycles. The composition gradient of H–/O2–in YHxO(3–x)/2films, in addition to the hydrogen-absorbing ability of the top electrode, is essential for effective device operation. Our findings show that hydride-conducting solid-state electrolytes are suitable for resistive switching device development.