Akihito Shinozaki, Yuuki Morita, Satoru Morita, Mizuho Morita: "Oxide thickness Dependence of Photo Currents of MOS Tunneling Diodes"Extended Abstracts of the 9th Workshop on FORMATION CHARACTERIZATION AND RELIABILITY OF ULTRATHIN SILICON OXIDE. 317-320 (
Akihito Shinozaki, Yuuki Morita, Satoru Morita, Mizuho Morita: "Oxide thickness Dependence of Photo Currents of MOS Tunneling Diodes"Extended Abstracts of the 9th Workshop on FORMATION CHARACTERIZATION AND RELIABILITY OF ULTRATHIN SILICON OXIDE. 317-320 (
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Akihito Shinozaki、Yuuki Morita、Satoru Morita、Mizuho Morita：“MOS 隧道二极管光电流的氧化物厚度依赖性”第九届超薄二氧化硅形成特性和可靠性研讨会的扩展摘要。
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