Real-time three-dimensional profiling of ferroelectric domain walls
Real-time three-dimensional profiling of ferroelectric domain walls
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DOI：
10.1063/1.4933171
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发表时间：
2015-10-12
影响因子：
4
通讯作者：
Eng, L. M.
中科院分区：
文献类型：
--
作者：
Kaempfe, T.;Reichenbach, P.;Eng, L. M.
铁电畴壁不仅影响铁电材料的性能，而且还表现出其独特的功能。因此，很明显，DW的路径是主要的兴趣。然而，对于薄膜，映射样品表面的畴图案通常足以获得所需的信息，而对于体样品则不是这种情况。实际上，从畴图案的表面图像外推到DW的三维（3D）行为通常是不够的。为了克服这个问题，我们开发了一种3D成像技术，可以高分辨率追踪大块样品中DW的路径，例如针对毫米厚LiNbO 3晶体内的不规则DW进行了示例性演示。基于费米子的光学非线性和利用干涉方法，我们比较了基波和二次谐波之间的光程差，从一个单一的二维平面激光扫描产生一个完整的3D地图的DW。该技术的短图像采集时间还可以使得能够记录动态DW过程。(C)2015 AIP Publishing LLC.
Ferroelectric domain walls (DWs) do not only affect the properties of a ferroelectric material, but they also exhibit themselves fascinating functionalities. Hence, it is quite evident that the pathway of DWs is of major interest. Whereas, for thin films, mapping the domain pattern at the samples' surface is usually sufficient to obtain the information wanted, this is not the case for bulk samples. Indeed, extrapolating from surface images of domain patterns to the three-dimensional (3D) behavior of DWs is, in general, not adequate. In order to overcome this problem, we developed a 3D imaging technique that allows to trace the pathway of DWs in bulk samples with high resolution, exemplarily demonstrated for an irregular DW inside a mm-thick LiNbO3 crystal. Based on the optical nonlinearity of fermelectrics and taking advantage of an interferometric approach, we compare the optical path differences between fundatnental and second harmonic waves, yielding a full 3D map of the DW from a single two-dimensional planar laser-scan. The short image acquisition time of this technique might furthermore enable to record dynamic DW processes. (C) 2015 AIP Publishing LLC.