A novel software-based defect-tolerance approach for application-specific embedded systems
A novel software-based defect-tolerance approach for application-specific embedded systems
复制标题
针对特定应用嵌入式系统的一种新颖的基于软件的缺陷容限方法
DOI：
10.1109/iccd.2011.6081441
复制
发表时间：
2011
期刊：
影响因子：
--
通讯作者：
S. Gupta
中科院分区：
文献类型：
--
作者：
Da Cheng;S. Gupta
提高良率的传统方法基于使用硬件冗余 (HR)，但由于布局复杂性增加和返回效应减弱，其优势在高缺陷密度时受到限制。这项研究基于这样一种观察：如果软件级技术满足两个条件，则在使用具有一个或多个不可修复内存模块的芯片时，可以保证用户程序的完全正确操作：（1）缺陷仅影响少数内存单元而不是导致整个内存模块故障，以及（2）要么我们不使用受未修复缺陷影响的内存的任何部分，要么我们确实使用受影响的部分，但只能以不会激发未修复缺陷导致错误的方式。本文提出了一种基于软件的缺陷容错 (SBDT) 方法，与 HR 相结合，将有缺陷的存储芯片用于特定应用系统。
Traditional approaches for improving yield are based on the use of hardware redundancy (HR), and their benefits are limited for high defect densities due to increasing layout complexities and diminishing return effects. This research is based on an observation that completely correct operation of user programs can be guaranteed while using chips with one or more unrepairable memory modules if software-level techniques satisfy two condistions: (1) defects only affect a few memory cells rather than cause malfunction for the entire memory module, and (2) either we do not use any part of the memory affected by the un-repaired defect, or we do use the affected part, but only in a manner that does not excite the un-repaired defect to cause errors. This paper proposes a software-based defect-tolerance (SBDT) approach in combination with HR to utilize defective memory chips for application-specific systems.