Nano precision on-machine profiling of curved diamond cutting tools using a white-light interferometer
Nano precision on-machine profiling of curved diamond cutting tools using a white-light interferometer
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DOI:
10.1504/ijsurfse.2007.016695
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发表时间:
2007
影响因子:
0.8
通讯作者:
Jiwang Yan;Hiroyasu Baba;Y. Kunieda;N. Yoshihara;T. Kuriyagawa
中科院分区:
文献类型:
--
作者:
Jiwang Yan;Hiroyasu Baba;Y. Kunieda;N. Yoshihara;T. Kuriyagawa
A non-contact on-machine measurement method is proposed for evaluating the profile accuracy of curved diamond cutting tools. The system is based on a compact white-light interferometer which is mounted on a three-axis numerical-controlled ultraprecision machine tool. An algorithm was developed to automatically identify the cutting edge location using the three-dimensional measurement data. Then the cross-sectional profile of the tool is extracted and the distribution of tool profile error is obtained. To measure tools with wide window angles and large curvatures, a data-stitching technique has been proposed for connecting the individually measured profiles from various orientations of the tool.