Data Structure Engineering For Byte-Addressable Non-Volatile Memory
Data Structure Engineering For Byte-Addressable Non-Volatile Memory
复制标题
字节寻址非易失性存储器的数据结构工程
DOI：
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
Wolfgang Lehner
中科院分区：
文献类型：
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作者：
Ismail Oukid;Wolfgang Lehner
存储级内存（SCM）正在成为传统DRAM的可行替代品，减轻了其在容量和能耗方面的可扩展性限制，同时具有非易失性。因此，SCM有可能成为一种通用存储器，模糊了众所周知的存储层次结构。然而，伴随着机遇，供应链管理也带来了许多挑战。在本教程中，我们将剖析SCM面临的挑战，并提供一个深入的视图，以了解规避这些挑战的现有编程模型，以及源于这些模型的新颖数据结构。我们还将详细说明故障安全测试的挑战——一个经常被忽视，但很重要的主题。最后，我们将讨论SCM仿真技术，用于基于SCM的软件组件的端到端测试。与调查数据库系统中SCM使用情况的调查相反，本教程是为对在数据库系统中利用SCM感兴趣的研究人员和专业人员设计的编程指南。
Storage Class Memory (SCM) is emerging as a viable alternative to traditional DRAM, alleviating its scalability limits, both in terms of capacity and energy consumption, while being non-volatile. Hence, SCM has the potential to become a universal memory, blurring well-known storage hierarchies. However, along with opportunities, SCM brings many challenges. In this tutorial we will dissect SCM challenges and provide an in-depth view of existing programming models that circumvent them, as well as novel data structures that stem from these models. We will also elaborate on fail-safety testing challenges -- an often overlooked, yet important topic. Finally, we will discuss SCM emulation techniques for end-to-end testing of SCM-based software components. In contrast to surveys investigating the use of SCM in database systems, this tutorial is designed as a programming guide for researchers and professionals interested in leveraging SCM in database systems.