High-precision Microwave Frequency Measurement Based on Stimulated Brillouin Scattering With Simple Configuration
High-precision Microwave Frequency Measurement Based on Stimulated Brillouin Scattering With Simple Configuration
复制标题
基于受激布里渊散射的高精度微波频率测量,配置简单
DOI:
10.1109/jlt.2022.3167853
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发表时间:
2022-07
影响因子:
4.7
通讯作者:
Junqiang Sun
中科院分区:
文献类型:
--
作者:
Wenting Jiao;Qiang Huang;Chukun Huang;Haotian Shi;Junqiang Sun
We propose and implement a microwave frequency measurement (MFM) scheme based on stimulated Brillouin scattering (SBS) and an apodized fiber Bragg grating (AFBG), achieving high accuracy in a wide range of measurement with a highly simplified configuration. By sweeping a reference frequency during SBS process, a frequency-to-power mapping between the reference frequency and the monitored output optical power of the MFM system is established. Unknown frequencies can be identified through a specific numerical relationship among the unknown frequency, reference frequency, and Brillouin frequency shift (BFS). The transmission and reflection properties of the AFBG are exploited to offer pump light and probe light simultaneously for SBS process, thereby reducing complexity of the MFM system. It can be derived theoretically that all frequencies larger than one BFS can be measured except for 3/2 BFS. This measurement blind spot can be eliminated by utilizing two segments of single-mode fibers with different BFSs. A measurement error of less than ±1 MHz within 10.68 GHz to 20 GHz is achieved in a proof-of-concept experiment of the proposed MFM approach. This method has also been proved to be applied to dual microwave frequency measurements.