Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter
Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter
复制标题
扫描干涉显微镜用于检测凝聚态物质中的超小相移
DOI:
10.1103/physreva.73.021802
复制
发表时间:
2006
影响因子:
2.9
通讯作者:
W. Moerner
中科院分区:
文献类型:
--
作者:
Jaesuk Hwang;M. Fejer;W. Moerner
We describe a scanning optical microscope based on polarization Sagnac interferometry for measuring ultrasmall phase shifts, and use this method to detect small numbers of absorbing molecules in a solid without the use of fluorescence. The absorption and concomitant optical phase shift of terrylene dopant molecules in a $p$-terphenyl host crystal are made time dependent by periodic optical saturation of the sample. A detection sensitivity of $8.75\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}8}\phantom{\rule{0.3em}{0ex}}\mathrm{rad}$ is achieved with a $0.078\phantom{\rule{0.3em}{0ex}}\mathrm{Hz}$ bandwidth, and detection of signals from as few as $19\ifmmode\pm\else\textpm\fi{}3$ terrylene molecules is demonstrated at room temperature.